PUBLICATIONS

Recent publications on research, applications and methods

PAPER: The surface area and localised 3D roughness of a highly structured surface using X-Ray Computed tomography (XCT)

23rd July 2020

The characterisation of a highly structured surface is explored. The surface investigated has both high aspect ratio and hidden features. A regular AgNi (80/20) electrical contact has been structured using a scanning electron-beam, with the objective of wear reduction during arcing events. An X-Ray Computed tomography system (XCT) is used to provide data of the whole surface and the data then referenced against a standard calibrated high gauge confocal optical surface metrology system using standard surface metrology software. To allow the surface analysis of the XCT data, the workflow and associated data processing steps are described. The results show that the XCT method provides surface data on the whole surface area including the hidden features, but that the data resolution and associated uncertainty, limits the accuracy of the roughness evaluation. The full surface area is determined using a combination of optical and XCT data.

REPORT: An Introduction to Confocal Scanning Systems

xyris2020_sens_LB50

23rd July 2020

XYRIS 3D Non-Contact Profilers use a chromatic light-based technology to measure any material surface: transparent, opaque, specular, diffusive, polished or rough. Unlike a touch probe technique, the non-contact technique can measure inside tight areas and will not add any intrinsic errors due to deformation caused by the tip pressing on a softer plastic material. Chromatic light-based technology also offers superior lateral and height accuracies compared to focus variation technology. XYRIS Profilers can scan large surfaces directly without stitching and profile the length of a part in a few seconds. Nano through macro range surface features and high surface angles can be measured due to the profiler’s ability to measure surfaces without any complex algorithms manipulating the results. This report provides users with an understanding of the technology and the data format. The information is essential to all users of XYRIS instruments and the accompanying software analysis package BEX®